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Halation Microscope Product List

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Halleation Microscope

Halleation Microscope

Microscope using halation lighting. Detects invisible scratches and dirt with a reflected light method.

Using a halation lighting system that utilizes reflected light, we achieve exceptionally high-resolution images of cracks, scratches, and dirt that are difficult to see with conventional direct lighting. (Left side reference comparison image: dent on a motor shaft) Since a small angle reflection image can be obtained, surface protrusions are easy to observe, making tasks such as quality inspection significantly easier. We also offer an optimal model for curved surface observation, which will help resolve issues with observing R surfaces. ● Capable of observing particles down to 4 microns at 50-300x zoom and down to 2 microns at 100-600x zoom (models can be selected based on the observation target). ● Clear images with outstanding versatility. ■ For reference comparison images and detailed catalogs, please download and view.

  • Optical microscope
  • Microscope

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Haleration Microscope Wide Field Curved Surface Pursuit Version

Haleration Microscope Wide Field Curved Surface Pursuit Version

The Halation Microscope provides lossless images due to the direct reflection of externally illuminated light.

This is an introduction to the "Halation Microscope Wide Field Curved Surface Pursuit Version (with Lighting Controller)." It is a microscope designed for observing curved surfaces with a zoom magnification of 0.2 to 1.6 times. This R lighting features a controller that allows for selective illumination of 11 rows, cutting out unnecessary lighting and focusing on "seeing the unseen" for surface observation. It ensures a field of view of 24×18mm, enabling wider field observations of scratches and dents on shafts and metal pipes, as well as cracks and chips in mounted components. The effective use of lighting further enhances its capabilities as an image sensor tool, allowing for even broader range observations.

  • Microscope

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High Magnification Surface Observation Halation Microscope - Premium Version

High Magnification Surface Observation Halation Microscope - Premium Version

Haleration Microscope: Zoom 1.5 to 9 times. Can see particles down to 2μ! Powerful for detecting scratches and cracks.

This is an introduction to the "High-End High Magnification Surface Observation Halation Microscope." It features a telecentric zoom lens that allows observation at a zoom magnification of 1.5 to 9.0 times, along with halation lighting, achieving high magnification and high-quality images, maintaining its status as the best microscope for surface observation that "sees the unseen." With a zoom magnification of 1.5 to 9.0 times, it can observe particles down to 2 microns and is an exceptionally versatile video microscope, particularly effective for detecting scratches, cracks, and more.

  • Microscope

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Haleration Microscope "PS..S7Z0108-50"

Haleration Microscope "PS..S7Z0108-50"

Harelation Microscope, wide-field popular version, for flat observation with a maximum field of view of 48×15mm (up to 10 microns).

The Halation Video Microscope "PS-100-S7Z0108-50" is a wide-field popular version designed for flat observation with a maximum field of view of 48×15mm (7x to 26x on a 15" monitor, down to 10 microns). It features a zoom magnification of 0.1 to 0.8 times with a macro zoom lens and wide-field halation lighting, allowing for the observation of a 50×15mm specular reflection image. It is offered as a wide-field flat observation microscope for "seeing the unseen." This versatile microscope makes it easy to narrow down targets and find them through magnified observation. For more details, please download the catalog.

  • Microscope
  • 3D measuring device
  • Other lighting equipment

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Optimal R lighting halation microscope for surface appearance observation!

Optimal R lighting halation microscope for surface appearance observation!

Observation range exceeds 60°! A microscope that allows you to see scratches on shafts, pins, rivets, circuit boards, IC chips, etc., in a raised state of unevenness. Also adopted as an automatic inspection device!

The "Harelation Microscope" is a microscope that employs Harelation R lighting. It enables surface observation without shadows. It achieves high-resolution images with a telecentric zoom lens that allows observation at magnifications from 0.75x to 4.5x. It is ideal for observing and inspecting circular, polygonal, and spherical indentations, scratches, and dirt that are difficult to see with conventional reflected lighting. 【Main Applications】 ■ Inspection of ITO used in EL, LCD, and touch panels → Can be observed even when liquid crystals are present ■ Inspection of cracks, scratches, and dirt on IC chips ■ Observation of unevenness such as mirror finishes, foreign objects, scratches, and pinholes ■ Determination of foreign objects, scratches, and dirt on glass and plastic, as well as front and back sides ■ Inspection of pinholes, peeling, and scratches in thin films, vapor deposition, and coatings 　　　　　【Limited-Time Campaign Benefit】 We will provide images of the work we have received for free! If requested, we can also come for a demonstration. Please feel free to contact us through the 【Contact】 section below! *Information on flat observation and the new Harelation three-eyed tube stereo microscope 　⇒ For more details, please download and refer to the catalog. *

  • Other microscopes

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24mm field of view R illumination halation microscope

24mm field of view R illumination halation microscope

The Halation Microscope provides lossless images due to the direct reflection of external illumination.

This is a curved surface observation microscope that can be observed at a zoom magnification of 0.2 to 1.6 times. It is equipped with a unique halation R lighting system that provides a field of view of 24×18 mm, making it a microscope for surface observation without shadows, allowing you to "see the unseen." It is a versatile microscope that can be applied to a wide range of observations, including scratches and dents on φ16 shafts, lens scratches, bubbles, cracks, and chips in metal pipes, which could not be observed with conventional methods.

  • Microscope

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Haleration Microscope "PS-100-S6Z45C"

Haleration Microscope "PS-100-S6Z45C"

It comes with a height reading dial, allowing for depth measurement as well, making it highly versatile.

The external illumination captures the specular reflection image. As a result, the color of the workpiece disappears, but all elements that hinder reflection, such as scratches, dents, cracks, and dirt, can be observed as shadows in the image. A reflection image with a small angle can be obtained, allowing for the confirmation of the surface's raised condition. The image on the left is a comparative image captured using the halation microscope "PS-100-S6Z45C" (medium magnification) for planar observation, showing the ITO of the LCD under halation lighting and incident lighting. The image under incident lighting does not show the ITO, while the image under halation lighting clearly reveals the ITO.

  • Microscope
  • 3D measuring device
  • Other lighting equipment

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Halation Microscope "PS-100-S6Z90A"

Halation Microscope "PS-100-S6Z90A"

Since it is a specular reflection image due to external illumination, an image without loss can be obtained.

The external illumination captures the specular reflection image. As a result, the color of the workpiece disappears, but all factors that hinder reflection, such as scratches, dents, cracks, and dirt, can be observed as shadows in the image. A reflection image with a small angle can be obtained, allowing for the confirmation of the surface's raised condition. The image on the left shows a comparative image of dirt on an IC chip captured using the "PS-100-S6Z90A" halation microscope for planar observation (high magnification) with halation lighting and reflected lighting. The image taken with reflected lighting does not capture the dirt, while the image taken with halation lighting clearly shows the dirt.

  • Microscope
  • 3D measuring device
  • Other lighting equipment

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Haleration Microscope "PS..S7Z16R100-2"

Haleration Microscope "PS..S7Z16R100-2"

With its unique lighting effect, it has become possible to observe curved and R surfaces.

The halation lighting system utilizing specular reflection allows for the capture of images of cracks, scratches, and dirt that are difficult to see with conventional incident lighting, achieving outstanding high-resolution images. Since a reflection image with a small angle can be obtained, it is now possible to observe surface irregularities "more easily," "more reliably," and "more quickly" than before, significantly simplifying tasks such as quality inspection. This is the optimal model for curved surface observation and will help resolve issues related to observing R surfaces. The image on the left is a comparison captured by the halation microscope "PS-100-S7Z16R100-2" for curved surface observation, showing scratches and mold on the lens surface using both halation and incident lighting. The incident lighting image captures only a small part of the scratches on the lens, while the halation lighting image clearly captures both the scratches and the mold.

  • Microscope
  • 3D measuring device
  • Other lighting equipment

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Haleration Microscope "PS..S7Z16R100-2M"

Haleration Microscope "PS..S7Z16R100-2M"

Haleration Microscope with a maximum field of view of 24×18mm, designed for R illumination curved surface observation, equipped with an illumination controller.

Haleration Microscope "PS-100-S7Z16R100-2M" Wide Field Curved Surface Version, Maximum Field of View 24×18mm for R Lighting Curved Surface Observation (13x to 53x on a 15" monitor, with 11-column lighting selection controller). This is a microscope for curved surface observation that can be observed at a zoom magnification of 0.2 to 1.6 times. The R lighting features a controller that allows for selective illumination of 11 columns, cutting out unnecessary lighting and focusing on "seeing the unseen" for surface observation. It secures a field of view of 24×18mm, enabling wider field observations of scratches, dents on shafts and metal pipes, cracks, and chips in mounted components, and the effective use of lighting further enhances the capabilities of this imaging sensor tool. For more details, please download the catalog.

  • Microscope
  • 3D measuring device
  • Other lighting equipment

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New product! Halation Microscope

New product! Halation Microscope

"PS-100-S7Z45D" is an image with no loss due to specular reflection from external illumination.

The external illumination captures the specular reflection image. As a result, the color of the workpiece is lost, but all factors that hinder reflection, such as scratches, dents, cracks, and dirt, can be observed as shadows in the image. A reflection image with a small angle can be obtained, allowing for the confirmation of the surface's raised condition. The moving image shown below is a comparative image captured with the halation microscope "PS-100-S7Z45D" (medium magnification) for flat observation, using halation lighting and incident lighting on a metal painted surface. The image under incident lighting makes it difficult to capture scratches, while the image under halation lighting does not capture color but clearly reveals the scratches.

  • Microscope
  • 3D measuring device
  • Other lighting equipment

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Halleation Microscope

Halleation Microscope

Observation of curved surfaces and R surfaces is also possible with unique lighting effects 'PS-100-S7Z45R100A'

The halation lighting system utilizing specular reflection allows for the capture of images of cracks, scratches, and dirt on cylindrical objects like shafts, which are difficult to see with conventional incident lighting, achieving outstanding high-resolution images. Since a specular reflection image can be obtained with external lighting, it enables observation of surface protrusions and other features "more easily," "more reliably," and "more quickly" than before, significantly simplifying tasks such as quality inspection. The halation microscope "PS-100-S7Z45R100A" is the optimal model for curved surface observation and will help resolve issues related to observing R surfaces. The moving image shown below is a comparative image captured using the halation microscope "PS-100-S7Z45R100A" (medium magnification) for curved surface observation, depicting a 2φ shaft illuminated with both halation lighting and incident lighting. The incident lighting image captures only the apex of the shaft, while the halation lighting image covers over 60°.

  • Microscope
  • 3D measuring device
  • Other lighting equipment

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Haleration Microscope "PS-100-S7Z90A"

Haleration Microscope "PS-100-S7Z90A"

Since it is a specular reflection image due to external illumination, an image without loss can be obtained.

The external illumination captures the specular reflection image. As a result, the color of the workpiece disappears, but all elements that hinder reflection, such as scratches, dents, cracks, and dirt, can be observed as shadows in the image. A reflection image with a small angle can be obtained, allowing for the confirmation of the surface's raised condition. The image on the left is a comparative image taken with the high-magnification halation microscope "PS-100-S7Z90A" for planar observation, capturing the ITO and spacers of the LCD using halation lighting and incident lighting. The image captured with incident lighting does not show the ITO, while the image captured with halation lighting clearly recognizes both the ITO and the spacers.

  • Microscope
  • 3D measuring device
  • Other lighting equipment

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【Special Campaign Price】Haleration Microscope

【Special Campaign Price】Haleration Microscope

Easily, quickly, and reliably inspect for dents, scratches, and dirt on surfaces! Achieve outstanding high-definition images!

※ Free distribution of sample evaluation images ※ Using a halation lighting system that utilizes specular reflection, we achieve outstanding high-definition images of cracks, scratches, and dirt on cylindrical objects such as shafts, which are difficult to see with conventional incident lighting. (Comparison images with incident lighting are available) Since a specular reflection image is obtained through external lighting, it is now possible to observe surface protrusions and conduct quality inspections "more easily," "more reliably," and "more quickly" than before. 【Reasons to Choose Us】 ■ Images are obtained without loss due to the specular reflection from external illumination. ■ We adopt a halation lighting system that divides a semicircle (140°) into ten parts. ■ The raised condition of dents, scratches, and dirt on the shaft surface can be confirmed. 【Limited-Time Campaign Benefits】 ■ Free provision of images taken of your work! ■ Special campaign price for a limited time! ■ We can visit for a demonstration if requested. For more details, please download the catalog or contact us. 【Information on Flat Observation and New Halation Three-Eye Tube Stereo Microscope】 ⇒ For more details, please refer to the 'Special Site.'

  • Microscope

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